• DocumentCode
    971884
  • Title

    Low-frequency diffraction by a planar junction of a metallic and a wire-mesh halfplane

  • Author

    Gilli, Marco ; Daniele, Vito

  • Author_Institution
    Dipartimento di Elettronica, Politecnico di Torino, Italy
  • Volume
    37
  • Issue
    3
  • fYear
    1995
  • fDate
    8/1/1995 12:00:00 AM
  • Firstpage
    343
  • Lastpage
    357
  • Abstract
    The canonical problem of an electromagnetic field incident on a metallic halfplane joined to a wire-mesh halfplane is considered. It is assumed that the wire radius is small in comparison with the spacing between the wires, and that this spacing is small with respect to the free-space wavelength. Under this hypothesis, it is shown that the problem can be solved in closed form by using a Wiener-Hopf technique for any nonuniform electromagnetic incident field. The field transmitted through the structure is computed, considering as uniform sources both TE and TM incident planewaves
  • Keywords
    diffraction gratings; electromagnetic shielding; electromagnetic wave diffraction; integral equations; spectral-domain analysis; TE incident planewaves; TM incident planewaves; Wiener-Hopf technique; closed form; electromagnetic field; low-frequency diffraction; metallic halfplane; nonuniform electromagnetic incident field; planar junction; spacing; transmitted waves; wire radius; wire-mesh halfplane; Apertures; Boundary conditions; Dielectrics; Electromagnetic diffraction; Electromagnetic fields; Electromagnetic shielding; Gratings; Surface impedance; Tellurium; Wire;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/15.406524
  • Filename
    406524