Title :
Scattering Analysis for the Modeling of THz Communication Systems
Author :
Piesiewicz, Radoslaw ; Jansen, Christian ; Mittleman, Daniel ; Kleine-Ostmann, Thomas ; Koch, Martin ; Kürner, Thomas
Abstract :
Modeling propagation channels for future pico-cellular indoor THz communication systems requires the knowledge of the reflective properties of building materials. The reflectivity of smooth, optically thick materials can be modeled with Fresnel equations. In case of materials with a rough surface, diffuse scattering reduces the power reflected in the specular direction. Kirchhoff scattering theory can be employed to derive modified Fresnel equations which account for these losses by introducing a Rayleigh roughness factor calculated from the measured surface height distribution of the sample under observation. Using the resulting, analytically derived reflection coefficient based on material parameter and surface measurements in propagation models enables the simulation of arbitrary configurations. We present a set of calculated and measured reflection coefficients for a selection of common indoor building materials which are in good agreement, thus verifying our modeling approach. Furthermore, we illustrate by ray-tracing simulations the effect of wall and ceiling roughness on propagation in future indoor scenarios. Both, absolute power levels and propagation patterns are shown to be strongly influenced by scattering. In some cases, reflected transmissions with longer propagation paths can be more efficient than the shorter ones in terms of incurred losses.
Keywords :
building materials; ceilings; electromagnetic wave reflection; electromagnetic wave scattering; indoor radio; picocellular radio; reflectivity; rough surfaces; submillimetre wave propagation; walls; wireless channels; Fresnel equations; Kirchhoff scattering theory; Rayleigh roughness factor; THz communication systems; ceiling roughness; cellular indoor communication; diffuse scattering; indoor building materials; modified Fresnel equations; optically thick materials; propagation channels; ray-tracing simulations; reflection coefficient; rough surface; smooth surface; surface height distribution; wall roughness; Building materials; Communication systems; Equations; Optical materials; Optical reflection; Optical scattering; Power system modeling; Rayleigh scattering; Rough surfaces; Surface roughness; Kirchhoff approximation; THz channel modeling; THz communication; ray-tracing; rough surface scattering;
Journal_Title :
Antennas and Propagation, IEEE Transactions on
DOI :
10.1109/TAP.2007.908559