DocumentCode
971958
Title
VLSI test system [New Products]
Volume
12
Issue
3
fYear
1995
Firstpage
9
Keywords
Automatic testing; Built-in self-test; Control system synthesis; EPROM; Emulation; Pricing; Read-write memory; Software testing; System testing; Very large scale integration;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1995.466361
Filename
466361
Link To Document