• DocumentCode
    972154
  • Title

    A laser-recrystallization technique for silicon-TFT integrated circuits on quartz substrates and its application to small-size monolithic active-matrix LCD´s

  • Author

    Fujii, Eiji ; Senda, Kohji ; Emoto, Fumiaki ; Yamamoto, Atsuya ; Nakamura, Akira ; Uemoto, Yasuhiro ; Kano, Gota

  • Author_Institution
    Matsushita Electron. Corp., Osaka, Japan
  • Volume
    37
  • Issue
    1
  • fYear
    1990
  • fDate
    1/1/1990 12:00:00 AM
  • Firstpage
    121
  • Lastpage
    127
  • Abstract
    The laser-recrystallization technique utilizes the connected-island structure for forming recrystallized silicon films with enlarged grain size controlled by the thermal gradient. This technique has been used to fabricate the driver circuits of small-size monolithic active-matrix liquid-crystal displays. A horizontal driver circuit with partially recrystallized silicon thin-film transistors (TFTs) has been successfully fabricated on quartz substrates, together with a vertical driver and active-matrix TFT circuits. The operating frequency of the fabricated horizontal driver circuits can be as high as 10 MHz under a clock voltage of 5 V
  • Keywords
    driver circuits; elemental semiconductors; field effect integrated circuits; integrated circuit technology; laser beam annealing; liquid crystal displays; recrystallisation; silicon; thin film transistors; 10 MHz; 5 V; Si-SiO2; SiO2; active-matrix TFT circuits; clock voltage; connected-island structure; driver circuits; grain size; laser-recrystallization technique; operating frequency; quartz substrates; recrystallized silicon films; silicon-TFT integrated circuits; small-size monolithic active-matrix liquid-crystal displays; thermal gradient; vertical driver TFT circuits; Active matrix liquid crystal displays; Active matrix technology; Driver circuits; Grain size; Optical control; Semiconductor films; Silicon; Size control; Substrates; Thin film transistors;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.43808
  • Filename
    43808