Title :
Anisotropy detection in sapphire by acoustic microscope using line-focus beam
Author :
Kushibiki, J. ; Ohkubo, A. ; Chubachi, N.
Author_Institution :
Tohoku University, Department of Electrical Engineering, Faculty of Engineering, Sendai, Japan
Abstract :
Nonscanning reflection acoustic microscopes can be satisfactorily applied to detect the anisotropy of acoustic properties of solid materials using a line-focus beam. As a demonstration, the anisotropic dependence of leaky surfac-acoustic-wave velocities on the propagation directions are measured on the water/Z-cut-sapphire boundary at a frequency of 200 MHz. The measured values are in good agreement with the calculated results within a difference of about 1%.
Keywords :
acoustic microscopes; sapphire; surface acoustic waves; ultrasonic velocity measurement; 200 MHz; leaky surface-acoustic-wave velocities; line-focus beam; nonscanning reflection acoustic microscope; sapphire; water/Z-cut-sapphire boundary;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19810374