DocumentCode
972162
Title
Anisotropy detection in sapphire by acoustic microscope using line-focus beam
Author
Kushibiki, J. ; Ohkubo, A. ; Chubachi, N.
Author_Institution
Tohoku University, Department of Electrical Engineering, Faculty of Engineering, Sendai, Japan
Volume
17
Issue
15
fYear
1981
Firstpage
534
Lastpage
536
Abstract
Nonscanning reflection acoustic microscopes can be satisfactorily applied to detect the anisotropy of acoustic properties of solid materials using a line-focus beam. As a demonstration, the anisotropic dependence of leaky surfac-acoustic-wave velocities on the propagation directions are measured on the water/Z-cut-sapphire boundary at a frequency of 200 MHz. The measured values are in good agreement with the calculated results within a difference of about 1%.
Keywords
acoustic microscopes; sapphire; surface acoustic waves; ultrasonic velocity measurement; 200 MHz; leaky surface-acoustic-wave velocities; line-focus beam; nonscanning reflection acoustic microscope; sapphire; water/Z-cut-sapphire boundary;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19810374
Filename
4245848
Link To Document