Title :
A linearly dispersive magnetostatic delay line at X-band
Author :
Daniel, M.R. ; Adam, J.D. ; O´Keeffe, T.W.
Author_Institution :
Westinghouse Research and Development Center, Pittsburgh, PA
fDate :
11/1/1979 12:00:00 AM
Abstract :
Experimentally verified calculations which have been performed show that the group delay versus frequency characteristic for magnetostatic forward volume waves in a YIG film of thickness t spaced an equal distance t from a ground plane can be essentially linear over a substantial frequency range. In particular, results are reported on an experimental YIG magnetostatic delay line which showed a linear delay ranging from 50 to 230 nS/cm (linearity ±3 nS/cm) over a 1 GHz bandwidth at X-band frequencies. The 20 μm thick YIG film, grown epitaxially on GGG, was spaced 20 μm above a ground plane using an alumina dielectric. The alumina was fabricated by: (a) thinning a conventional substrate by grinding and polishing; or (b) depositing Al2O3by rf sputtering. Input and output transducers were simple 5 mm long by 50 μm wide gold microstrip lines defined in 5 μm thick gold and open circuited at one end. Results obtained using a network analyzer were in close agreement with the theoretical calculation. The characteristic observed represents a potential pulse-compression factor of 230.
Keywords :
Delay lines; Magnetostatic volume-wave materials/devices; YIG films; Bandwidth; Delay lines; Dielectric substrates; Dispersion; Frequency; Gold; Linearity; Magnetostatic waves; Propagation delay; Sputtering;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1979.1060371