Exchange anisotropy for providing dual bias in magnetoresistive heads

Author

Cain, William C. ; Kryder, Mark H.

Author_Institution

Magnetics Technol. Center, Carnegie-Mellon Univ., Pittsubrgh, PA, USA

Volume

25

Issue

3

fYear

1989

fDate

5/1/1989 12:00:00 AM

Firstpage

2787

Lastpage

2788

Abstract

The large bias field produced by exchange anisotropy at the interface of NiFe-TbCo thin films is considered for providing dual bias in magnetoresistive (MR) heads. Exchange-biased NiFe-TbCo MR heads that exhibit a linear response (applied field range: ±50 Oe) and greatly reduced Barkhausen noise have been produced. Dual exchange bias is accomplished by directing a component of the exchange field along the longitudinal direction for domain stabilization and directing another component of exchange field along the transverse direction for linearization

Keywords

cobalt alloys; exchange interactions (electron); iron alloys; magnetic heads; magnetic thin film devices; magnetoresistance; nickel alloys; terbium alloys; NiFe-TbCo thin films; domain stabilization; dual bias; exchange anisotropy; exchange field; linear response; magnetoresistive heads; reduced Barkhausen noise; Amorphous magnetic materials; Amorphous materials; Anisotropic magnetoresistance; Antiferromagnetic materials; Ferrimagnetic films; Magnetic heads; Magnetic noise; Noise reduction; Temperature sensors; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.24523

Filename

24523