• DocumentCode
    972207
  • Title

    Alternating beam method (ABM) in photothermal microscopy (PTM) and photoacoustic microscopy (PAM)

  • Author

    Lehto, A. ; Jokinen, Markku ; Jaarinen, J. ; Tiusanen, T. ; Luukkala, M.

  • Author_Institution
    University of Helsinki, Department of Physics, Helsinki, Finland
  • Volume
    17
  • Issue
    15
  • fYear
    1981
  • Firstpage
    540
  • Lastpage
    541
  • Abstract
    In measuring thermal properties of nearly uniform surfaces, it is often difficult to resolve small differences in the surfaces. The letter reports a differential method to measure small variations with the detector operating as a null detector. This method is applied to measure the thickness of plasma-sprayed coatings.
  • Keywords
    acoustic microscopes; photoacoustic effect; thickness measurement; alternating beam method; differential method; null detector; photoacoustic microscopy; photothermal microscopy; plasma-sprayed coatings; thickness measurement;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19810378
  • Filename
    4245852
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=972207