DocumentCode
972244
Title
Influence of channel doping-profile on camel-gate field effect transistors
Author
Lour, Wen-Shiung ; Tsai, Jung-Hui ; Laih, Lih-Wen ; Liu, Wen-Chau
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Ocean Univ., Taiwan
Volume
43
Issue
6
fYear
1996
fDate
6/1/1996 12:00:00 AM
Firstpage
871
Lastpage
876
Abstract
We report the performance of GaAs camel-gate FETs and its dependence on device parameters. In particular, the performance dependence on the doping-profile of a channel was investigated. In this study, one-step, bi-step, and tri-step doping channels with the same doping-thickness product are employed in camel-gate FETs, while keeping other parameters unchanged, For a one-step doping channel FET, theoretical analysis reveals that a high doping channel would provide a large transconductance which is suitable for logic applications. Decreasing the channel concentration increases the drain current and the barrier height. For a tri-step doping channel FET, it is found that the output drain current and the barrier height remain large and the relatively voltage-independent transconductance is also increased. These are the requirements for the large input signal power amplifiers. A fabricated camel-gate FET with a tri-step doping channel exhibits a large drain current density larger than 750 mA/mm and a potential barrier greater than 1.0 V. Furthermore, the relatively voltage-independent transconductance is as high as 220 mS/mm and the applied gate voltage is up to +1.5 V. A 1.5×100 μm2 device is found to have a ft of 30 GHz with a very low input capacitance
Keywords
III-V semiconductors; capacitance; characteristics measurement; doping profiles; field effect transistors; gallium arsenide; semiconductor device models; semiconductor doping; 1.5 V; 30 GHz; GaAs; barrier height; camel-gate field effect transistors; channel concentration; channel doping-profile; doping-thickness product; drain current; input capacitance; output drain current; potential barrier; transconductance; Capacitance; Doping profiles; FETs; Gallium arsenide; Logic; MESFETs; Millimeter wave technology; Semiconductor diodes; Transconductance; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.502117
Filename
502117
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