DocumentCode :
972482
Title :
Verifying Functional Specifications by Regression Techniques on Lissajous Test Signatures
Author :
Balado, Luz ; Lupon, Emili ; Figueras, Joan ; Roca, Miquel ; Isern, Eugeni ; Picos, Rodrigo
Author_Institution :
Dept. of Electron. Eng., Univ. Politec. de Catalunya, Barcelona
Volume :
56
Issue :
4
fYear :
2009
fDate :
4/1/2009 12:00:00 AM
Firstpage :
754
Lastpage :
762
Abstract :
In this paper, a low-cost method to verify functional specifications of analog VLSI circuits is proposed. The method is based on the analysis of Lissajous signatures combined with regression techniques. In order to obtain Lissajous signatures, the observation space is partitioned into zones using hyperplanes, and a set of integer values used as the digital signature of the circuit is generated by Lissajous curve zone crossings. A predictor function obtained by nonlinear regression techniques predicts the functional specification parameters of the circuit under consideration. The viability of this methodology is analyzed and applied to verify the center frequency f 0 of a bandpass biquad filter. Experimental measurements show an accurate prediction of the center frequency of the designed filter.
Keywords :
VLSI; digital signatures; integrated circuit testing; regression analysis; Lissajous curve zone crossings; Lissajous test signatures; analog VLSI circuits; digital signature; functional specifications; hyperplanes; nonlinear regression techniques; predictor function; $X{-}Y$ zoning; Analog- and mixed-signal (M-S) circuit verification; Lissajous signatures; digital signatures; parameter prediction;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2008.2004342
Filename :
4663654
Link To Document :
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