Title :
Distributed scaling approach of MESFETs and its comparison with the lumped-element approach
Author :
Mondal, Jyoti P.
Author_Institution :
Honeywell Inc., Bloomington, MN, USA
fDate :
7/1/1989 12:00:00 AM
Abstract :
An appropriate scaling procedure is described for large four-finger MESFET cells with experimental verification. A comparison is presented between lumped and distributed modeling approaches. The scalability of elements in the equivalent circuit model of a MESFET is discussed
Keywords :
Schottky gate field effect transistors; semiconductor device models; MESFETs; distributed modeling; equivalent circuit model; four-finger MESFET cells; lumped-element approach; scalability; scaling procedure; Distributed control; Equivalent circuits; FETs; Feeds; Fingers; MESFETs; Power amplifiers; Power system modeling; Radio frequency; Scalability;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on