DocumentCode :
972520
Title :
Analysis of the inductive turn-off of double gate MOS controlled thyristors
Author :
Huang, Alex Q.
Author_Institution :
Virginia Power Electron. Centre, Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Volume :
43
Issue :
6
fYear :
1996
fDate :
6/1/1996 12:00:00 AM
Firstpage :
1029
Lastpage :
1032
Abstract :
High voltage inductive turn-off of double gate MOS Controlled Thyristors (MCTs) are analyzed using two-dimensional numerical simulations. Analysis shows that beside the significantly improved maximum controllable current and reduced switching loss, the electric field distribution in these devices has two peaks during inductive turn-off, enabling the maximum turn-off power density to be twice as high as that of the single gate devices. This observation also applies to other double gate bipolar power devices such as double gate Insulated Gate Bipolar Transistors (IGBTs)
Keywords :
MOS-controlled thyristors; digital simulation; electric fields; losses; semiconductor device models; semiconductor device reliability; double gate MOS controlled thyristors; electric field distribution; inductive turn-off; maximum controllable current; switching loss; turn-off power density; two-dimensional numerical simulations; Anodes; Cathodes; Insulated gate bipolar transistors; MOSFETs; Medical simulation; Numerical simulation; Switching loss; Tail; Thyristors; Voltage control;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.502140
Filename :
502140
Link To Document :
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