Title :
Identifying untestable faults in sequential circuits
Author :
Liang, Hsing-Chung ; Lee, Chunglen ; Chen, Jwu E.
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Controllability; Electrical fault detection; Fault detection; Fault diagnosis; Feedback circuits; Sequential analysis; Sequential circuits;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.1995.466367
