• DocumentCode
    972808
  • Title

    A 2/3-in 400k-pixel sticking-free stack-CCD image sensor

  • Author

    Sasaki, Michio ; Ihara, Hisanori ; Matsunaga, Yoshiyuki

  • Author_Institution
    ULSI Res. Center, Toshiba Corp., Kawasaki, Japan
  • Volume
    28
  • Issue
    11
  • fYear
    1993
  • fDate
    11/1/1993 12:00:00 AM
  • Firstpage
    1066
  • Lastpage
    1070
  • Abstract
    A 2/3-in 400k-pixel stack-CCD image sensor overlaid with an amorphous silicon photoconversion layer has been developed with FIT architecture. The image sticking, which occurred under 10000× standard-incident light conditions, is completely suppressed to the invisible level with bias charge injection operation into the a-Si photoconversion layer. Furthermore, the fixed pattern noise (FPN) of 30 electronsp-p at 60°C has been achieved by 0.6-V biased storage diodes
  • Keywords
    CCD image sensors; charge storage diodes; semiconductor device noise; 0.6 V; 0.66 in; 400 kpixel; 60 C; FIT architecture; Si; a-Si photoconversion layer; bias charge injection operation; biased storage diodes; fixed pattern noise; image sticking suppression; sticking-free stack-CCD image sensor; Amorphous silicon; Charge coupled devices; Charge-coupled image sensors; Diodes; Electrodes; Electrons; Equivalent circuits; Image sensors; Image storage; Registers;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.245583
  • Filename
    245583
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=972808