DocumentCode :
973135
Title :
On the effectiveness of residue code checking for parallel two´s complement multipliers
Author :
Sparmann, U. ; Reddy, Sudhakar M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
Volume :
4
Issue :
2
fYear :
1996
fDate :
6/1/1996 12:00:00 AM
Firstpage :
227
Lastpage :
239
Abstract :
The effectiveness of residue code checking for online error detection in parallel two´s complement multipliers has only up until now been evaluated experimentally for few architectures. In this paper a formal analysis is given for most of the current multiplication schemes. Based on this analysis it is shown which check bases are appropriate, and how the original scheme has to be extended for complete error detection at the input registers and Booth recoding circuitry. In addition, we argue that the hardware overhead for checking can be reduced by approximately one half if a small latency in error detection is acceptable. Schemes for structuring the checking logic in order to guarantee it to be self-testing, and thus achieve the totally self-checking goal for the overall circuit, are also derived.
Keywords :
VLSI; arithmetic codes; automatic testing; built-in self test; digital arithmetic; error analysis; error detection; error detection codes; integrated circuit testing; integrated logic circuits; logic testing; multiplying circuits; parallel processing; Booth recoding circuitry; check bases; error detection; formal analysis; hardware overhead reduction; input registers; multiplication schemes; online error detection; parallel two´s complement multipliers; residue code checking; self-testing; totally self-checking; Built-in self-test; Circuits; Cities and towns; Computer errors; Encoding; Hardware; Parallel algorithms; Rails; Registers; Very large scale integration;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/92.502194
Filename :
502194
Link To Document :
بازگشت