DocumentCode :
973175
Title :
Analysis of media defects in thick recording media
Author :
Hoagland, A.S. ; Oehme, W.F. ; Talke, F.E.
Author_Institution :
IBM Research Laboratory, San Jose, California
Volume :
15
Issue :
6
fYear :
1979
fDate :
11/1/1979 12:00:00 AM
Firstpage :
1552
Lastpage :
1554
Abstract :
The defect behavior of thick particulate media is investigated by introducing artificial defects of known depth, measuring their signal loss characteristics as a function of frequency, and then relating actual measured drop-out lengths to the experimentally determined artificial defect depth data. The results indicate that the number of drop-outs per track is exponentially related to a "critical depth" parameter. The data can be used to extrapolate density capabilities of a given medium using a set of experimental artificial defect data taken at a lower performance level.
Keywords :
Magnetic disk recording; Density measurement; Frequency estimation; Frequency measurement; Laboratories; Length measurement; Loss measurement; Particle measurements; Shape; Size measurement; Thickness measurement;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1979.1060454
Filename :
1060454
Link To Document :
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