• DocumentCode
    973298
  • Title

    A New Model to Simulate Critical Current Degradation of a Large CICC by Taking Into Account Strand Bending

  • Author

    Koizumi, Norikiyo ; Nunoya, Yoshihiko ; Okuno, Kiyoshi

  • Author_Institution
    Japan Atomic Energy Agency, Ibaraki
  • Volume
    16
  • Issue
    2
  • fYear
    2006
  • fDate
    6/1/2006 12:00:00 AM
  • Firstpage
    831
  • Lastpage
    834
  • Abstract
    The ITER model coil experiments have revealed that degradation of the critical current (Ic) and n index occurred in large Nb 3Sn CICC´s and the larger the electromagnetic force, the larger was the degradation. However, such degradation was not observed in the Nb3Al CICC. The authors developed a new model, in which the degradation of the Ic and n index of an individual strand was taken into account, to interpret these results. Analytical model corrected from experimental results of a single strand is used in this model to estimate the degradation of each strand. The calculation results are in good agreement with the CICCs´ test results. In addition, it is indicated that in case of the Nb3Sn CICC, the normal transition occurs from the strands at low field side in CICC cross section, where transverse load due to the electromagnetic force is the largest, resulting in the significant degradation in the Ic and the n index. In contrast, in the case of the Nb3Al CICC, the normal transition takes place from the strands at high field in the CICC cross section, where the transverse load is small, resulting in no degradation in the Ic and the n index
  • Keywords
    bending; critical currents; niobium alloys; superconducting cables; superconducting coils; superconducting transitions; tin alloys; CICC; ITER model coil; Nb3Sn; critical current degradation; strand bending; transition; Analytical models; Coils; Critical current; Degradation; Electromagnetic forces; Electromagnetic modeling; Magnetic field induced strain; Magnetic field measurement; Strain measurement; Testing; CICC; ITER; critical current; degradation; strand bending;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2005.869640
  • Filename
    1642976