Title :
Multiple fault diagnosis by sensitizing input pairs
Author :
Yanagida, Nobuhiro ; Takahashi, Hiroshl ; Takamatsu, Yuzo
Keywords :
Circuit faults; Circuit testing; Combinational circuits; Dictionaries; Fault detection; Fault diagnosis; Fault location; Large scale integration; Logic design; Logic testing;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.1995.466375
