DocumentCode :
973376
Title :
Subcircuit diagnostic process
Volume :
12
Issue :
3
fYear :
1995
Firstpage :
47
Keywords :
Circuit faults; Circuit testing;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1995.466377
Filename :
466377
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=973376
