DocumentCode :
973386
Title :
Value deduction algorithm
Volume :
12
Issue :
3
fYear :
1995
Firstpage :
48
Keywords :
Circuit faults; Circuit testing; Fault diagnosis;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1995.466378
Filename :
466378
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=973386
