Title :
Plug-and-play I/sub DDQ/ Testing for test fixtures
Author :
Baker, Keith ; Hales, Alan
Keywords :
Bridge circuits; Circuit faults; Circuit testing; Fault detection; Fixtures; Instruments; Observability; Production; Test pattern generators; Voltage;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.1995.466379
