Title :
Wafer testing of thin film record and reproduce heads
Author :
Druyvesteyn, W.F. ; Postma, L. ; Somers, G.
Author_Institution :
Philips Research Laboratories, Eindhoven, The Netherlands
fDate :
11/1/1979 12:00:00 AM
Abstract :
The magnetic behaviour of thin film record and reproduce heads has been tested by measurements on the wafer; an "extra" turn was integrated in the magnetic yoke. Domain structures were visualized by using a ferrofluid solution. The domain structure depends on track width, which affects on the permeability and saturation current of the head.
Keywords :
Magnetic domains; Magnetic measurements; Magnetic recording/reading heads; Magnetic anisotropy; Magnetic domains; Magnetic flux; Magnetic heads; Magnetic materials; Magnetostriction; Perpendicular magnetic anisotropy; Saturation magnetization; Testing; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1979.1060482
