• DocumentCode
    973791
  • Title

    A 3-D mode matching technique for the efficient analysis of coplanar MMIC discontinuities with finite metallization thickness

  • Author

    Alessandri, Ferdinand0 ; Baini, Gianluca ; Mongiardo, Mauro ; Sorrentino, Roberto

  • Author_Institution
    Istituto di Elettronica, Perugia Univ., Italy
  • Volume
    41
  • Issue
    9
  • fYear
    1993
  • fDate
    9/1/1993 12:00:00 AM
  • Firstpage
    1625
  • Lastpage
    1629
  • Abstract
    A technique is proposed for the efficient analysis of CPW discontinuities including finite metallization thickness. The transverse resonance technique (TRT) is modified by introducing an impressed source that allows a cavity of fixed, instead of variable, dimensions to be analyzed (impressed source technique, IST). At the same time, as with TRT, the field analysis of only homogeneously filled waveguides is required so avoiding the computation of frequency dependent as well as complex modes as with the conventional mode matching technique. On this basis, an extremely efficient code for the analysis of CPW discontinuities, applicable also to interacting discontinuities, is obtained. The same code, which incorporates the modal spectrum of an L-shaped waveguide, can be used to compute a large class of CPW discontinuities including steps, gaps, open ends, etc. Computed results are shown to be in remarkable agreement with the experiments and confirm that the finite metallization thickness may significantly affect the electrical characteristics of CPW circuits
  • Keywords
    MMIC; metallisation; microstrip components; waveguide theory; 3D mode matching technique; CPW circuits; CPW discontinuities; L-shaped waveguide; coplanar MMIC discontinuities; coplanar waveguides; field analysis; finite metallization thickness; gaps; homogeneously filled waveguides; impressed source technique; interacting discontinuities; modal spectrum; open ends; steps; transverse resonance technique; Bridge circuits; Conductors; Coplanar waveguides; Electric variables; Frequency dependence; MMICs; Metallization; Resonance; Slotline; Waveguide discontinuities;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.245688
  • Filename
    245688