• DocumentCode
    974011
  • Title

    Outdiffusion as a Technique for the Production of Diodes and Transistors

  • Author

    Halpern, J. ; Rediker, R.H.

  • Author_Institution
    Lincoln Laboratory, M.I.T., Lexington, Mass.
  • Volume
    46
  • Issue
    6
  • fYear
    1958
  • fDate
    6/1/1958 12:00:00 AM
  • Firstpage
    1068
  • Lastpage
    1076
  • Abstract
    The outdiffusion process, which consists of the extraction of impurities from a semiconductor wafer by heating it to an elevated temperature in a high vacuum, is shown to be a practical method for the production of diodes and transistors. The usefulness of outdiffusion as a technique for device fabrication depends on how easily impurities can be evaporated from the crystal surface. The surface-evaporation velocity K which characterizes the ease of removal of impurities has been determined for the evaporation of antimony out of germanium at 700°C and is (1.5±0.5)×10-8 cm/sec. This value is large enough to indicate that it is definitely feasible to make high-frequency devices by outdiffusion. Narrow base germanium computer diodes have been fabricated that have a forward drop of 0.11 volt at 1 ma and that switch at speeds up to 5 mc. The operation of these graded base diodes is analyzed. Germanium n-p-n graded base transistors have also been fabricated which have grounded-emitter current gains, ß, of over 100 and alpha frequency cutoffs, f¿co, of above 200 mc.
  • Keywords
    Fabrication; Forward contracts; Germanium; Heating; P-n junctions; Production; Semiconductor diodes; Semiconductor impurities; Semiconductor materials; Switches;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IRE
  • Publisher
    ieee
  • ISSN
    0096-8390
  • Type

    jour

  • DOI
    10.1109/JRPROC.1958.286845
  • Filename
    4065446