• DocumentCode
    974411
  • Title

    Irradiation effects on Ge-H, Al-H, and other H-related point defects in cultured quartz crystals

  • Author

    Bahadur, Harish

  • Author_Institution
    Nat. Phys. Lab., New Delhi, India
  • Volume
    43
  • Issue
    3
  • fYear
    1996
  • fDate
    6/1/1996 12:00:00 AM
  • Firstpage
    2085
  • Lastpage
    2095
  • Abstract
    Cultured quartz crystals with high concentration of Al and Ge have been investigated for their hydroxyl defects upon irradiation at 77 K before and after 300-K irradiation. The hydroxyl defects act as a source of hydrogen to-compensate the electron excess defects of aluminum centers during irradiation of quartz crystals. In this study, a comparison has been presented between differently grown Ge-doped crystals and a Sawyer Premium Q crystal. In particular, Ge-H, Al-H, and other H-related defect centers have been investigated and analyzed. During the irradiation process, some new bands appear at the expense of the already existing bands. A novel defect center absorbing at 3400 cm -1 has been noticed in two of the Ge-doped crystals. This band is a different species of point defects than the one absorbing at this frequency as one of the growth defect bands. A model has been assigned to this radiation-induced band. Other results have been discussed in terms of the fundamental considerations about the quartz crystal lattice
  • Keywords
    aluminium; defect absorption spectra; electron beam effects; germanium; impurity absorption spectra; infrared spectra; point defects; quartz; 300 K; 3400 cm-1; 77 K; Al-H point defects; Ge-H point defects; Ge-doped crystals; H-related point defects; IR spectra; Sawyer Premium Q crystal; SiO2:Ge,Al; bands; cultured quartz crystals; growth defect bands; hydroxyl defects; irradiation effects; quartz crystal lattice; Aluminum; Crystalline materials; Crystallization; Crystals; Electrons; Frequency; Hydrogen; Impurities; Lattices; Temperature sensors;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.502303
  • Filename
    502303