DocumentCode
974584
Title
Effect of energy relaxation on injected current pulse in high-frequency IMPATT diodes
Author
Lippens, Didier ; Constant, Eric
Author_Institution
Université de Lille I, Centre Hyperfréquences et Semiconducteurs, LA CNRS 287, Villeneuve d´Ascq, France
Volume
17
Issue
23
fYear
1981
Firstpage
878
Lastpage
879
Abstract
The effect of energy relaxation on carrier injection in millimetre-wave IMPATT diodes is considered. For this purpose, an approximate formula relating the current pulse injected in the transit region, including the energy relaxation, is derived. Its influence on the RF impedance of the impatt oscillator is discussed.
Keywords
IMPATT diodes; carrier mobility; impact ionisation; IMPATT oscillator; RF impedance; carrier injection; energy relaxation; high-frequency IMPATT diodes; injected current pulse; microwave devices;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19810612
Filename
4246094
Link To Document