Title : 
CCD linear image sensor with buried overflow drain structure
         
        
            Author : 
Goto, Hiromi ; Sekine, H. ; Yamada, Tomoaki ; Suzuki, Nobuhiro
         
        
            Author_Institution : 
Toshiba Corporation, Semiconductor Division, Kawasaki, Japan
         
        
        
        
        
        
        
            Abstract : 
A CCD linear image sensor with buried overflow drain structure has been developed. Since the overflow drain, i.e. a reverse biased n-region buried under photosites arrayed in p-layer, makes an effective sink of excess electrons, imaging characteristics such as uniformity of photosensitivity, spectral response, resolution, and antiblooming, are highly improved.
         
        
            Keywords : 
charge-coupled device circuits; image sensors; CCD linear image sensor; buried overflow drain structure; imaging characteristics; optoelectronic devices;
         
        
        
            Journal_Title : 
Electronics Letters
         
        
        
        
        
            DOI : 
10.1049/el:19810630