Title :
Excess-noise and receiver sensitivity measurements of In0.53Ga0.47As/InP avalanche photodiodes
Author :
Forrest, Stephen R. ; Williams, G.F. ; Kim, O.K. ; Smith, R.G.
Author_Institution :
Bell Laboratories, Murray Hill, USA
Abstract :
We report the results of excess-noise and normalised receiver sensitivity measurements for In0.53Ga0.47As/InP avalanche photodiodes for use in the ¿=0.95 ¿m to 1.65 ¿m spectral region. The excess-noise measurements are consistent with a hole-to-electron ionisation rate ratio in InP of ~ 0.4. The receiver sensitivity, measured at 45 Mbit/s and 10¿9 bit-error-rate, was ¿53.2 dBm at a gain of 20 assuming unity quantum efficiency for the detector. This sensitivity is the highest reported at ¿=1.3 ¿m and represents an improvement over a PIN detector using the same amplifier.
Keywords :
III-V semiconductors; avalanche photodiodes; electron device noise; gallium arsenide; indium compounds; receivers; sensitivity; -53.2 dBm receiver sensitivity; 0.95 micron to 1.65 micron; GaAs; In compounds; In0.53Ga0.47As/InP avalanche photodiodes; excess-noise measurements; normalised receiver sensitivity measurements; spectral region;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19810639