Title :
Studies of semitransparent optoelectronic position sensors
Author :
Bauer, Florian ; Danielyan, Varuzhan ; Horvat, Sandra ; Kroha, Hubert
Author_Institution :
Max-Planck-Inst. fur Phys., Munich, Germany
fDate :
6/1/2004 12:00:00 AM
Abstract :
Semitransparent optoelectronic position sensors (ALMY sensors) have been developed for high-precision multipoint position and angle measurements of collimated laser beams over a large measurement range. The sensors provide a position resolution in the order of a micrometer over sensitive areas of several square centimeters. They consist of a thin film of amorphous silicon deposited on a glass substrate between two transparent layers of crossed strip electrodes. A transmittance of 80%-90% has been achieved for 780-nm laser light produced by diode lasers. We report about recent optimizations of the sensor performance and tests of the long-term stability under laser illumination and of the radiation tolerance at high neutron doses. As expected, the radiation hardness of the amorphous silicon sensors exceeds the one of crystalline silicon devices. The custom-designed readout electronics allow for operation at sufficiently low laser intensities in order to prevent significant degradation of the performance of the amorphous silicon sensors under illumination with laser light.
Keywords :
amorphous semiconductors; angular measurement; elemental semiconductors; laser beam effects; neutron effects; photodetectors; position measurement; radiation hardening (electronics); readout electronics; semiconductor thin films; silicon; 780 nm; ALMY sensors; Si; alignment system; amorphous silicon; amorphous silicon sensors; angle measurements; collimated laser beams; crossed strip electrodes; crystalline silicon devices; custom-designed readout electronics; diode lasers; glass substrate; high neutron doses; large measurement range; laser diodes; laser illumination; laser light; micrometer; multipoint position; optimizations; optoelectronic position sensors; radiation hardness; radiation tolerance; sensor performance; sensor tests; silicon strip sensors; thin film; Amorphous silicon; Collimators; Goniometers; Laser beams; Laser stability; Lighting; Optoelectronic and photonic sensors; Position measurement; Semiconductor thin films; Sputtering; Alignment system; amorphous silicon; laser beams; laser diodes; silicon strip sensors;
Journal_Title :
Sensors Journal, IEEE
DOI :
10.1109/JSEN.2004.826738