DocumentCode :
974986
Title :
Remarks on the use of multilayer perceptrons for the analysis of chemical sensor array data
Author :
Pardo, Matteo ; Sberveglieri, Giorgio
Author_Institution :
Dept. of Chem. & Phys., Univ. of Brescia, Italy
Volume :
4
Issue :
3
fYear :
2004
fDate :
6/1/2004 12:00:00 AM
Firstpage :
355
Lastpage :
363
Abstract :
Multilayer perceptrons (MLPs) are a standard tool for establishing relationships between data in many real world problems, in the absence of a parametric model. In the last decade, they have often been used for analyzing data produced by arrays of chemical sensors [electronic noses (e-noses)]. Still, the central issue of controlling the complexity of an MLP for optimal generalization is frequently overlooked by chemical sensors practitioners causing incorrect or suboptimal results (over or underfitting). In this paper, we will: 1) present different ways of controlling the complexity of an MLP (model order selection, early stopping, and regularization); 2) shortly review the literature on complexity control, inside and outside the e-nose community; and 3) give examples of effective complexity control for two e-noses datasets of different size and learning difficulty. It will be shown that, if early stopping or regularization are adopted, overfitting is avoided whatever the number of hidden units (and, hence, network weights). Another issue tackled in this paper is the influence on the generalization error of the number of principal components over which data are projected (before being fed into the MLP). Simulations show that (test set) performance depends strongly on the number of principal components and that even components with less than 1% of the global variance enhance classification.
Keywords :
chemical sensors; data analysis; multilayer perceptrons; principal component analysis; MLPs; chemical sensors; complexity control; data analysis; e-noses; electronic noses; generalization error; global variance enhance classification; multilayer perceptrons; optimal generalization; overfitting; parametric model; sensor data; simulations; standard tool; test performance; test set; Centralized control; Chemical analysis; Chemical sensors; Data analysis; Electronic noses; Multilayer perceptrons; Optimal control; Parametric statistics; Sensor arrays; Size control; Chemical sensors; complexity control; data analysis; e-nose; electronic nose; multilayer perceptrons; overfitting;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2004.827207
Filename :
1294916
Link To Document :
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