DocumentCode :
975142
Title :
Influence of a step-tapered undulator field on the optical pulse shape of a far-infrared free-electron laser
Author :
Knippels, G.M.H. ; van de Meer, A.F.G. ; Mols, R.F.X.A.M. ; Oepts, D. ; van Amersfoort, P.W. ; Jaroszynski, D.A.
Author_Institution :
FOM Inst. for Plasma Phys., Nieuwegein, Netherlands
Volume :
32
Issue :
6
fYear :
1996
fDate :
6/1/1996 12:00:00 AM
Firstpage :
896
Lastpage :
904
Abstract :
The optical output of the free-electron laser for infrared experiments (FELIX), which operates in the regime of strong slippage, consists of picosecond pulses. Depending on the amount of cavity desynchronization, the optical pulse can develop substantial structure in the form of multiple subpulses. We present second-order autocorrelation measurements of the subpulses at several far-infrared wavelengths while applying a step-taper in the undulator field. The operation with a step-tapered undulator prevents the electrons from reabsorbing the optical field energy, leading to a smooth optical pulse. For different settings of the undulator the measured pulse shape and corresponding power spectrum are discussed. It is possible without decreasing the small-signal gain to produce a smooth high-power optical pulse during the whole saturated part of the machine pulse in an FEL oscillator with a reverse-step tapered undulator
Keywords :
free electron lasers; high-speed optical techniques; laser cavity resonators; wigglers; FEL oscillator; FELIX; cavity desynchronization; far-infrared free-electron laser; far-infrared wavelengths; high-power optical pulse; infrared experiments; machine pulse; multiple subpulses; optical field energy; optical output; optical pulse shape; picosecond pulses; power spectrum; reverse-step tapered undulator; second-order autocorrelation measurements; small-signal gain; step-taper; step-tapered undulator field; strong slippage regime; Autocorrelation; Electron optics; Free electron lasers; Optical pulse shaping; Optical pulses; Optical saturation; Pulse measurements; Shape measurement; Undulators; Wavelength measurement;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.502366
Filename :
502366
Link To Document :
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