• DocumentCode
    975756
  • Title

    Quantum efficiency analysis of thin-layer silicon solar cells with back surface fields and optical confinement

  • Author

    Brendel, R. ; Hirsch, M. ; Plieninger, R. ; Werner, J.H.

  • Author_Institution
    Max-Planck-Inst. fur Festkorperforschung, Stuttgart, Germany
  • Volume
    43
  • Issue
    7
  • fYear
    1996
  • fDate
    7/1/1996 12:00:00 AM
  • Firstpage
    1104
  • Lastpage
    1113
  • Abstract
    Thin-layer silicon solar cells utilize surface textures to increase light absorption and back surface fields to prevent recombination at the silicon-substrate interface. We present an analytical model for the internal quantum efficiency that accounts for light trapping and also considers carrier generation and recombination in back surface fields or substrates. We introduce a graphical representation of experimental data, the so-called Parameter-Confidence-Plot, which allows one to draw maximum information on diffusion lengths and surface recombination velocities from quantum efficiency measurements. The analysis is exemplified for state of the art thin-layer silicon solar cells with and without back surface fields
  • Keywords
    carrier lifetime; elemental semiconductors; semiconductor device models; silicon; solar cells; surface recombination; surface texture; 1D model; Si; analytical model; back surface fields; carrier generation; diffusion lengths; graphical representation; internal quantum efficiency; light absorption; light trapping; optical confinement; parameter-confidence-plot; quantum efficiency analysis; surface recombination velocities; surface textures; thin-layer Si solar cells; Analytical models; Length measurement; Optical surface waves; Photovoltaic cells; Radiative recombination; Silicon; Solar power generation; Space charge; Substrates; Surface texture;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.502422
  • Filename
    502422