• DocumentCode
    976258
  • Title

    Scanning the issue

  • Author

    Allen, John

  • Author_Institution
    Massachusetts Institute of Technology, Cambridge, MA, USA
  • Volume
    73
  • Issue
    11
  • fYear
    1985
  • Firstpage
    1539
  • Lastpage
    1540
  • Abstract
    Provides an overview of the technical articles and features presented in this issue.
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1985.13338
  • Filename
    1457606