Title :
Excess intensity noise originated from polarization fluctuation in vertical-cavity surface-emitting lasers
Author :
Mukaihara, T. ; Ohnoki, N. ; Hayashi, Y. ; Hatori, N. ; Koyama, F. ; Iga, K.
Author_Institution :
Precision & Intelligence Lab., Tokyo Inst. of Technol., Yokohama, Japan
Abstract :
We have observed an excess-intensity noise that is attributed to polarization fluctuations of InGaAs-GaAs vertical-cavity surface-emitting lasers (VCSELs). It was observed, for the first time, that the intensity noise increased remarkably by the polarization fluctuation even when the single transverse mode operation was maintained. This result indicates that it is necessary to control the polarization state of VCSELs as well as control the transverse modes for low-noise operations.<>
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; laser modes; laser noise; light polarisation; quantum well lasers; semiconductor device noise; surface emitting lasers; InGaAs-GaAs; InGaAs-GaAs vertical-cavity surface-emitting lasers; VCSEL; excess-intensity noise; light-current characteristics; low-noise operation; polarization fluctuation; polarization state control; quantum well active region; single transverse mode operation; transverse mode control; Distributed Bragg reflectors; Fluctuations; Laser modes; Laser noise; Optical noise; Optical polarization; Surface emitting lasers; Temperature; Threshold current; Vertical cavity surface emitting lasers;
Journal_Title :
Photonics Technology Letters, IEEE
