Title :
Wide-band de-embedding with a short, an open, and a through line
Author :
Vaitkus, Rimantas L.
Author_Institution :
Motorola, Inc., Phoenix, AZ, USA
Abstract :
A wide-band procedure for subtracting the effects of fixtures and device packages or carriers from measured scattering parameters with only a short, an open, and a through line as standards is presented.
Keywords :
Circuits; Equations; Fixtures; Impedance; Measurement standards; Packaging; Scattering parameters; Testing; Transmission line matrix methods; Wideband;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1986.13404
