Title :
A new InP-InGaAs HBT with a superlattice-collector structure
Author :
Chen, Jing-Yuh ; Guo, Der-Feng ; Cheng, Shiou-Ying ; Lee, Kuan-Ming ; Chen, Chun-Yuan ; Chuang, Hung-Ming ; Fu, Ssu-Yi ; Liu, Wen-Chau
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan
fDate :
5/1/2004 12:00:00 AM
Abstract :
The dc characteristics of an interesting InP-InGaAs heterojunction bipolar transistor (HBT) with a superlattice (SL) structure incorporated in the base-collector (B-C) junction are demonstrated. In the SL structure, holes injected from the collector collide with holes confined in the SL and impact them out of the SL across the valence-band discontinuities. With a collector-emitter (C-E) voltage VCE less than the C-E breakdown voltage BVCE0, the current gain can be increased at base-current inputs because the released holes from the SL inject into the base to cause the emitter-base junction operating under more forward-biased condition. An ac current gain up to 204 is obtained. At base-emitter voltage VBE inputs, the released holes travel to the base terminal to decrease the base current. The studied HBT exhibits common-emitter current gains exceeding 47 at low current levels and useful gains spreading over seven orders of magnitude of collector current.
Keywords :
III-V semiconductors; gallium arsenide; heterojunction bipolar transistors; impact ionisation; indium compounds; phosphorus compounds; semiconductor quantum wells; semiconductor superlattices; InP-InGaAs; base-collector junction; base-current inputs; collector-emitter breakdown voltage; current gain; dc characteristics; forward-biased condition; heterojunction bipolar transistor; impact ionization; multiple quantum well; superlattice structure; superlattice-collector structure; valence-band discontinuities; Breakdown voltage; Carrier confinement; Charge carrier processes; Electron mobility; Heterojunction bipolar transistors; Impact ionization; MOCVD; Optical devices; Quantum well devices; Superlattices;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2004.826978