Title :
The measurement of the properties of materials
Author :
Afsar, Mohammed Nurul ; Birch, J.R. ; Clarke, R.N. ; Chantry, G.W.
Author_Institution :
City University of New York, NY, USA
Abstract :
This review covers approximately 15 years of development in the techniques used to measure dielectric properties of materials over the frequency range 1 MHz to 1500 GHz. An introductory section summarizes the broad development trends and is followed by short sections which deal with developments at a more detailed level. The approaches described include time- and frequency-domain methods; reflection, transmission, and resonant methods, guided and free-space methods; discrete-frequency and broad-band methods, especially Fourier Transform Spectroscopy. Measurements on magnetic materials are also briefly discussed.
Keywords :
Dielectric losses; Dielectric materials; Dielectric measurements; Dielectric substrates; Fourier transforms; Frequency measurement; Laboratories; Magnetic materials; Permittivity measurement; Spectroscopy;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1986.13432
