• DocumentCode
    977521
  • Title

    Uniqueness problems in compact HBT models caused by thermal effects

  • Author

    Rudolph, Matthias

  • Author_Institution
    Ferdinand-Braun-Inst. fur Hochstfrequenztechnik, Berlin, Germany
  • Volume
    52
  • Issue
    5
  • fYear
    2004
  • fDate
    5/1/2004 12:00:00 AM
  • Firstpage
    1399
  • Lastpage
    1403
  • Abstract
    This paper identifies possible numerical instabilities in compact HBT models, which are introduced by a physical meaningful self-heating description. Removing these possible sources of nonconvergence would deteriorate model accuracy since they originate from the device physics. It is, therefore, necessary to be aware of them during parameter extraction and circuit simulation.
  • Keywords
    heterojunction bipolar transistors; numerical stability; semiconductor device models; circuit simulation; compact HBT models; nonconvergence; numerical instabilities; parameter extraction; self-heating; thermal effects; uniqueness problems; Circuit simulation; Diodes; FETs; Heterojunction bipolar transistors; Numerical models; Numerical stability; Robustness; Solid modeling; Temperature dependence; Temperature distribution;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2004.827007
  • Filename
    1295138
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=977521