DocumentCode :
977934
Title :
Electrical Compensation of OLED Luminance Degradation
Author :
Chaji, G. Reza ; Ng, Clement ; Nathan, Arokia ; Werner, Ansgar ; Birnstock, Jan ; Schneider, Oliver ; Blochwitz-Nimoth, Jan
Author_Institution :
Univ. of Waterloo, Waterloo
Volume :
28
Issue :
12
fYear :
2007
Firstpage :
1108
Lastpage :
1110
Abstract :
This letter presents a stable compensation scheme for active-matrix organic light-emitting-diode (AMOLED) displays based on the observed strong interdependence between the luminance degradation of organic light-emitting diodes (OLEDs) and its current drop under bias stress. This feedback-based compensation provides 30% improvement in luminance stability under 1600 h of accelerative stress. To employ this scheme in AMOLED displays, a new pixel circuit is presented that provides on-pixel electrical access to the OLED current without compromising the aperture ratio.
Keywords :
brightness; organic light emitting diodes; AMOLED; OLED luminance degradation; active-matrix organic light-emitting-diode; aperture ratio; electrical compensation; on-pixel electrical access; organic light-emitting diodes; Active matrix organic light emitting diodes; Active matrix technology; Circuits; Flat panel displays; Intelligent sensors; Optical feedback; Organic light emitting diodes; Technological innovation; Thermal degradation; Thin film transistors; Active-matrix organic light-emitting-diode (AMOLED) displays; feedback-based compensation; hydrogenated amorphous silicon (a-Si:H); organic light-emitting-diode (OLED) degradation; thin-film transistor (TFT); threshold voltage shift ($V_{T}$ shift);
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2007.909854
Filename :
4383530
Link To Document :
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