Title :
Lumped Parameter Behavior of the Single-Stage Thermoelectric Microrefrigerator
Author_Institution :
Nortronics, A Division of Northrop Corp., Hawthorne, Calif.
Keywords :
Electronics cooling; Helium; Infrared detectors; Nitrogen; Refrigerators; Senior members; Temperature sensors; Thermal conductivity; Thermal resistance; Thermoelectricity;
Journal_Title :
Proceedings of the IRE
DOI :
10.1109/JRPROC.1959.287051
