• DocumentCode
    978221
  • Title

    An 8-bit 200-MHz BiCMOS comparator

  • Author

    Lim, Peter J. ; Wooley, Bruce A.

  • Author_Institution
    Center for Integrated Syst., Stanford Univ., CA, USA
  • Volume
    25
  • Issue
    1
  • fYear
    1990
  • fDate
    2/1/1990 12:00:00 AM
  • Firstpage
    192
  • Lastpage
    199
  • Abstract
    The design of a fully differential BiCMOS comparator suitable for application in data conversion, instrumentation, and communication systems operating at video frequencies and above is discussed. By exploiting the advantages presented by the integration of both bipolar and CMOS devices within the same technology, the comparator dissipates less power than conventional bipolar designs without sacrificing operating speed. The comparator includes an input stage that combines MOS sampling with a bipolar regenerative amplifier. This stage dissipates no static power and, because the amplification is provided by a bipolar differential pair, no offset cancellation is needed to achieve 8-b precision. Furthermore, the need for preamplification and the attendant power-delay penalty associated with preamplifier overdrive recovery are avoided. An experimental version of the comparator, consisting of the BiCMOS regenerative input stage followed by a current-switched latch, has been integrated in a 0.8-μm BiCMOS technology with an area of 140×75 μm. This circuit performs comparisons to a precision of 8 b at rates up to 200 MHz. The entire circuit dissipates only 1.6 mW at the maximum clock rate while operating from a single 5-V supply
  • Keywords
    BIMOS integrated circuits; comparators (circuits); linear integrated circuits; 0.8 micron; 1.6 mW; 200 MHz; 5 V; 8 bit precision; BiCMOS comparator; MOS sampling; bipolar differential pair; bipolar regenerative amplifier; communication systems; data conversion; instrumentation; low power operation; monolithic IC; video frequencies; BiCMOS integrated circuits; CMOS technology; Clocks; Data conversion; Frequency conversion; Instruments; Integrated circuit technology; Latches; Preamplifiers; Sampling methods;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.50303
  • Filename
    50303