DocumentCode
978261
Title
Microwave power spectra of variable thickness sub-micron bridges
Author
Schwartz, D.B. ; Mankiewich, P.M. ; Jain, A.K. ; Lukens, J.E.
Author_Institution
State University of New York, Stony Brook, NY
Volume
17
Issue
1
fYear
1981
fDate
1/1/1981 12:00:00 AM
Firstpage
92
Lastpage
94
Abstract
The frequency variation of the radiated power and linewidth of variable thickness bridges from 2 to 18 GHz is reported. A new, simple technique for fabricating these bridges using electron beam lithography is described. The measured power is found to be in unexpectedly good agreement with that calculated using the resistively shunted junction model. The linewidth data are in striking disagreement with existing theories.
Keywords
Electron-beam applications; Josephson device oscillators; Microwave oscillators; Bridge circuits; Coaxial cables; Electrical resistance measurement; Electron beams; Foot; Frequency; Indium; Laboratories; Lithography; Power measurement;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1981.1060929
Filename
1060929
Link To Document