• DocumentCode
    978261
  • Title

    Microwave power spectra of variable thickness sub-micron bridges

  • Author

    Schwartz, D.B. ; Mankiewich, P.M. ; Jain, A.K. ; Lukens, J.E.

  • Author_Institution
    State University of New York, Stony Brook, NY
  • Volume
    17
  • Issue
    1
  • fYear
    1981
  • fDate
    1/1/1981 12:00:00 AM
  • Firstpage
    92
  • Lastpage
    94
  • Abstract
    The frequency variation of the radiated power and linewidth of variable thickness bridges from 2 to 18 GHz is reported. A new, simple technique for fabricating these bridges using electron beam lithography is described. The measured power is found to be in unexpectedly good agreement with that calculated using the resistively shunted junction model. The linewidth data are in striking disagreement with existing theories.
  • Keywords
    Electron-beam applications; Josephson device oscillators; Microwave oscillators; Bridge circuits; Coaxial cables; Electrical resistance measurement; Electron beams; Foot; Frequency; Indium; Laboratories; Lithography; Power measurement;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1981.1060929
  • Filename
    1060929