DocumentCode
978555
Title
Frequency dependence of the quality factor of Nb-Nbx Oy -Pb Josephson tunnel junctions
Author
Cucolo, A.M. ; Pace, S. ; Vaglio, R. ; Lacquaniti, V. ; Marullo, G.
Author_Institution
Università di Salerno, Salerno, Italy
Volume
17
Issue
1
fYear
1981
fDate
1/1/1981 12:00:00 AM
Firstpage
812
Lastpage
814
Abstract
In the context of Josephson devices optimization for the Italian Voltage Standard manteinance, the frequency dependence of the quality factor (Q) of Nb-Nbx Oy -Pb tunnel junctions has been carefully measured at various temperatures in the frequency range 10-160 GHz. The Q was determined via the measure of the amplitude of Fiske resonant modes in the junction. The different frequencies were obtained by changing the lenght of the junction after the liquid helium test through a photolitographic process. The results show that for our junctions, for current densities of 1-10 Amp/cm2,the only relevant contributions to the Q are the losses associated with the surface impedance of the superconducting films. The data show good agreement with the BCS theory if, as already pointed out by other authors, a small residual term is added to the conductivity.
Keywords
Josephson devices; Millimeter-wave measurements; Q measurement; Voltage measurement standards; Frequency dependence; Frequency measurement; Measurement standards; Q factor; Q measurement; Superconducting devices; Temperature dependence; Temperature distribution; Temperature measurement; Voltage;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1981.1060958
Filename
1060958
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