DocumentCode
978684
Title
Semimetal-barrier quasi-planar Josephson junction
Author
Ohta, Hiroshi
Author_Institution
The Institute of Physical and Chemical Research, Wako-shi, Saitama, Japan
Volume
17
Issue
1
fYear
1981
fDate
1/1/1981 12:00:00 AM
Firstpage
311
Lastpage
313
Abstract
Niobium-based bismuth-barrier Josephson junctions have been made whose geometrical structure is almost planar. The amplitudes of their zero-voltage currents and microwave-induced constant-voltage current-steps are periodically modulated by applied microwave radiation. Voltage current curves of the junctions have similar energy gap structures to those of point contact Josephson junctions. The value of the parameter S, defined as the ratio of the differential resistance just above the gap to that just below the gap, is about 2.0. The junctions have a barrier length of less than 100 nm, a very low capacitance and a life of several months even at room temperature. A quasi-planar Josephson junction has been turned out a hybrid of other kinds of Josephson junctions.
Keywords
Josephson devices; Bridge circuits; Electrodes; Hybrid junctions; Josephson effect; Josephson junctions; Oxidation; Superconducting materials; Superconducting thin films; Switches; Temperature;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1981.1060971
Filename
1060971
Link To Document