DocumentCode :
978684
Title :
Semimetal-barrier quasi-planar Josephson junction
Author :
Ohta, Hiroshi
Author_Institution :
The Institute of Physical and Chemical Research, Wako-shi, Saitama, Japan
Volume :
17
Issue :
1
fYear :
1981
fDate :
1/1/1981 12:00:00 AM
Firstpage :
311
Lastpage :
313
Abstract :
Niobium-based bismuth-barrier Josephson junctions have been made whose geometrical structure is almost planar. The amplitudes of their zero-voltage currents and microwave-induced constant-voltage current-steps are periodically modulated by applied microwave radiation. Voltage current curves of the junctions have similar energy gap structures to those of point contact Josephson junctions. The value of the parameter S, defined as the ratio of the differential resistance just above the gap to that just below the gap, is about 2.0. The junctions have a barrier length of less than 100 nm, a very low capacitance and a life of several months even at room temperature. A quasi-planar Josephson junction has been turned out a hybrid of other kinds of Josephson junctions.
Keywords :
Josephson devices; Bridge circuits; Electrodes; Hybrid junctions; Josephson effect; Josephson junctions; Oxidation; Superconducting materials; Superconducting thin films; Switches; Temperature;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1981.1060971
Filename :
1060971
Link To Document :
بازگشت