• DocumentCode
    978684
  • Title

    Semimetal-barrier quasi-planar Josephson junction

  • Author

    Ohta, Hiroshi

  • Author_Institution
    The Institute of Physical and Chemical Research, Wako-shi, Saitama, Japan
  • Volume
    17
  • Issue
    1
  • fYear
    1981
  • fDate
    1/1/1981 12:00:00 AM
  • Firstpage
    311
  • Lastpage
    313
  • Abstract
    Niobium-based bismuth-barrier Josephson junctions have been made whose geometrical structure is almost planar. The amplitudes of their zero-voltage currents and microwave-induced constant-voltage current-steps are periodically modulated by applied microwave radiation. Voltage current curves of the junctions have similar energy gap structures to those of point contact Josephson junctions. The value of the parameter S, defined as the ratio of the differential resistance just above the gap to that just below the gap, is about 2.0. The junctions have a barrier length of less than 100 nm, a very low capacitance and a life of several months even at room temperature. A quasi-planar Josephson junction has been turned out a hybrid of other kinds of Josephson junctions.
  • Keywords
    Josephson devices; Bridge circuits; Electrodes; Hybrid junctions; Josephson effect; Josephson junctions; Oxidation; Superconducting materials; Superconducting thin films; Switches; Temperature;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1981.1060971
  • Filename
    1060971