• DocumentCode
    978719
  • Title

    IDDQ test invalidation by break faults

  • Author

    Dalpasso, Marcello ; Favalli, Michele ; Olivo, Piero

  • Author_Institution
    Dipartimento di Elettronica, Inf. e Sistemistica, Bologna Univ.
  • Volume
    32
  • Issue
    11
  • fYear
    1996
  • fDate
    5/23/1996 12:00:00 AM
  • Firstpage
    994
  • Lastpage
    995
  • Abstract
    The effectiveness of IDDQ testing for bridging faults in CMOS ICs can be decreased if break faults are present in the circuit. The robustness to such invalidation is investigated here, leading to claims for a better test pattern generation for IDDQ testing. As for the proposed solution, test vectors that activate a larger number of different current paths can build a more robust test sequence
  • Keywords
    CMOS integrated circuits; fault diagnosis; integrated circuit testing; CMOS ICs; IDDQ testing; break faults; bridging faults; invalidation robustness; quiescent power-supply current monitoring; test pattern generation;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19960626
  • Filename
    503076
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=978719