Title :
Inductance and capacitance analytic formulas for VLSI interconnects
Author :
Delorme, Nicolas ; Belleville, Marc ; Chilo, Jose
Author_Institution :
CEA, Centre d´Etudes Nucleaires de Grenoble
fDate :
5/23/1996 12:00:00 AM
Abstract :
A set of analytical formulas is derived for inductance and capacitance modelling of interconnect wirings in sub-half-micrometre VLSI circuits. They yield accurate estimates of propagation and rise times and of crosstalk noise for a wide range of geometries
Keywords :
VLSI; capacitance; crosstalk; inductance; integrated circuit design; integrated circuit modelling; 0.5 micron; VLSI interconnects; analytic formulas; capacitance modelling; crosstalk noise; inductance modelling; interconnect wirings; propagation time; rise time; sub-half-micron VLSI circuits;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19960689
