Title :
Analysis of printed transmission lines for monolithic integrated circuits
Author :
Shih, Y.C. ; Itoh, T.
Author_Institution :
University of Texas at Austin, Department of Electrical Engineering, Austin, USA
Abstract :
Planar transmission lines formed with MIS and Schottky barrier contacts are analysed based on the spectral domain technique. Depending on the frequency and the resistivity of the substrates, three different types of fundamental modes are predicted. The calculated slow-wave factors and attenuation constants agree well with experimental results.
Keywords :
Schottky effect; metal-insulator-semiconductor devices; microwave integrated circuits; monolithic integrated circuits; strip lines; waveguide theory; MIS contacts; Schottky barrier contacts; attenuation constants; fundamental modes; microstrip lines; microwave integrated circuits; monolithic integrated circuits; printed transmission lines; slow-wave factors; spectral domain technique;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19820401
