Title : 
Methodology for fast identification of EMIinduced operating point shift in analogue circuits
         
        
            Author : 
Loeckx, J. ; Gielen, G.
         
        
            Author_Institution : 
Dept. Elektrotech., Katholieke Univ. Leuven, Leuven
         
        
        
        
        
            Abstract : 
One of the major harmful effects of electromagnetic interference (EMI) is the change of the DC operating point of a circuit due to rectification caused by the interference signals. A methodology is presented that gives designers an accurate estimate of the operating point shift and that identifies the devices that are the key contributors.
         
        
            Keywords : 
analogue circuits; electromagnetic interference; rectification; EMI; analogue circuits; electromagnetic interference; interference signals; operating point shift; rectification;
         
        
        
            Journal_Title : 
Electronics Letters
         
        
        
        
        
            DOI : 
10.1049/el:20071584