• DocumentCode
    979196
  • Title

    On the physical understanding of the kT-layer concept in quasi-ballistic regime of transport in nanoscale devices

  • Author

    Clerc, Raphaël ; Palestri, Pierpaolo ; Selmi, Luca

  • Author_Institution
    IMEP, Grenoble
  • Volume
    53
  • Issue
    7
  • fYear
    2006
  • fDate
    7/1/2006 12:00:00 AM
  • Firstpage
    1634
  • Lastpage
    1640
  • Abstract
    The aim of this paper is to establish a well-defined theoretical background in which the kT-layer concept and the empirical expression of the backscattering coefficient introduced by Lundstrom and co-workers to describe the role of scattering in nanoscale devices under high-field conditions and quasi-ballistic transport regime are derived analytically. To this purpose, one-dimensional (1-D) Boltzmann transport equation is solved in the framework of a "relaxation length" approximation, leading to a set of drift-diffusion like transport equations. This set of equations is then solved in a template 1-D structure (with a linear potential energy profile), leading to an analytical expression for the backscattering coefficient, which is equal, in the limit of low- and high-electric fields, to the formulas proposed by Lundstrom This approach allows us to identify the exact assumptions and qualitative validity limits of these formulas
  • Keywords
    Boltzmann equation; MOSFET; approximation theory; ballistic transport; nanoelectronics; semiconductor device models; Boltzmann transport equation; MOSFET device; backscattering coefficient; high-field conditions; kT-layer concept; nanoscale devices; nanoscale transport; quasi-ballistic transport; relaxation length approximation; Backscatter; Boltzmann equation; CMOS technology; Educational technology; Helium; MOSFET circuits; Nanoscale devices; Numerical simulation; Scattering; Silicon devices; Ballistic transport; Boltzmann-transportequation; MOSFET; nanoscale transport;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2006.876387
  • Filename
    1643497