DocumentCode :
979470
Title :
X-band power characterisation of AlInN/AlN/GaN HEMT grown on SiC substrate
Author :
Sarazin, Nicolas ; Jardel, O. ; Morvan, E. ; Aubry, R. ; Laurent, M. ; Magis, M. ; Tordjman, M. ; Alloui, M. ; Drisse, O. ; Di Persio, J. ; Poisson, M. A Di Forte ; Delage, S.L. ; Vellas, N. ; Gaquiere, C. ; Théron, D.
Author_Institution :
III-V Lab., Alcatel-Thales, Marcoussis
Volume :
43
Issue :
23
fYear :
2007
Abstract :
AllnN/AlN/GaN based HEMTs were fabricated on SiC substrate to demonstrate the high potentiality of these heterostructures. The presented results confirm the high performances reachable by AllnN based technology with an output power of 6.8 W/mm at 10 GHz with a gate length of 0.25 mum. A good extrinsic transconductance value of 400 mS/mm was also measured on these transistors. The results are believed to be the best power results published about AllnN/GaN HEMTs.
Keywords :
high electron mobility transistors; silicon compounds; HEMT; SiC substrate; X-band power characterisation; extrinsic transconductance;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:20072598
Filename :
4384296
Link To Document :
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